Monday, 22 July 2013

Automated Defect Localization via Low Rank Plus Outlier Modeling of Propagating Wavefield Data. (arXiv:1307.5102v1 [cs.CV])

Comments: 16 pages, 9 figures, Submitted to the IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control on August 30th 2012

View the original article here

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